HP-C-VE Optical Probe

The whole Field of View (FOV) or specific Regions of Interest (ROI) within the FOV can be used to select one or more features for measurement (e.g. hole diameters, edge positions). Software control of the illumination allows the user to optimise the image for each measurement.

Typical HP-C-VE applications:

  • Small features which are difficult to probe with tactile styli
  • Soft or easily deformed components
  • Printed or deposited patterns
  • Printed circuit boards

Back to Products