LSP-S4 Scanning Probe

In addition to its ability to accept long styli, the LSP-S4 excels with its low trigger forces - ideal for measuring delicate surfaces. Its long travel means that the LSP-S4 is not susceptible to damage caused by collisions.

Probing deflections are measured via high resolution Linear Variable Differential Transducers (LVDT). The LSP-S4 supports all the standard probing modes like Single Point Probing, Self-Centering as well as Continuous High-Speed-Scanning for fast and accurate form and profile measurements.

Like all other Leitz probe heads, the LSP-S4 provides simultaneous and unclamped probing in all axes, always orthogonal to the surface. This allows the correct compensation of any styli deflection.

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